Risk-based vision and dimensional verification for critical components.
| Program Metric | Typical Range | Procurement Value |
|---|---|---|
| Measurement accuracy | Micron-level, method-dependent | Matches measurement resolution to the tolerance and feature access. |
| Inspection methods | Optical measurement, microscopy, CMM, surface checks | Matches the measurement method to each drawing-critical dimension. |
| Outgoing records | Material certs, dimensional report, inspection summary | Gives buyers audit-ready evidence for sample and pilot lots. |
| Decision Factor | Confirm Before Quote | Buyer Impact |
|---|---|---|
| Inspection intent | Incoming qualification, in-process control, final release, or enhanced outgoing screening. | Matches the inspection method and cost to actual program risk. |
| Measurement method | Optical measurement, microscopy, pin gauge, CMM, surface roughness, or custom fixture. | Prevents using a method that cannot resolve the tolerance being quoted. |
| Report format | CTQ list, sample size, AQL, data table, images, pass/fail criteria, and lot fields. | Makes the inspection package useful for supplier qualification and internal release. |
Yes, detailed reports accompany every batch.
Yes. Prototype lots can focus on CTQ dimensions, burr condition, slot geometry, surface observations, and images that support the buyer validation plan.
Inquiry Email
Best for drawings, tolerance tables, inspection needs, and quote history.
Instant Chat
+8618857971991
Fast path for OD/ID, material, sample quantity, and lead-time questions.
